传统的基于统计方法的可靠性验证试验的样本量大、试验时间长，难以满足现今高可靠性、长寿命电子产品研制的短周期和低成本要求。工作采用“数理统计+故障物理”的方法，针对多失效产品提出系统多应力加速验证试验方法。基于系统可靠性指标按环境应力进行分配的思路，从功能、结构、机理、应力4个层次确定出关键功能、薄弱环节、主要失效模式及敏感环境应力，逐级进行可靠性指标分解，构建可靠性综合试验与单项环境试验关系，设计出试验方案和试验剖面。首先研究模糊层次分析可靠性分配方法，将系统可靠性指标分配至各单元的敏感应力，接着采用应力-强度干涉模型推导各应力放大系数，然后由加速因子不变原则推导出系统加速因子，结合统计试验方案，设计系统加速验证试验方案。最后，以某固态硬盘试验验证为例，阐述整套流程，并与GJB899A和IEC62506标准方法进行对比，显示了本方法的有效性。
The traditional statistical analysis-based reliability demonstration testing (RDT) requires a large number of samples and long testing time, failing to satisfy the development demand for short cycle and low cost of electronic products nowadays. We propose a system-level reliability accelerated demonstration testing (RADT) program for multi-failure mode products under multiple stresses by combining mathematical statistics and physics of failure (PoF). Based on the principle of allocating reliability target to each environment stress, products are decomposed at four levels, namely function, structure, mechanism, and stress, and the key function, weakness, dominant failure mode, and sensitive stress can be identified, respectively. After level-by-level allocations, the RADT plan and test profile can be established by connecting environmental testing and reliability testing. Firstly, system reliability is apportioned to each environmental stress based on fuzzy logic and analytic hierarchy process. Secondly, the stress-strength interference model is used to deduce the amplification coefficient for each stress. The overall acceleration factor can be derived by the principle of constant acceleration factor, and then the RADT scheme can be designed based on a statistical plan. A case example is presented to illustrate the effectiveness of the proposed approach in comparison with programs of GJB899A and IEC62506.
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