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中国科学院大学学报 ›› 2021, Vol. 38 ›› Issue (1): 121-129.DOI: 10.7523/j.issn.2095-6134.2021.01.015

• 电子科学 • 上一篇    下一篇

基于模糊层次分析法的系统加速验证试验设计

李鹏1,2, 党炜1,2, 李桃3, 吕从民1,2   

  1. 1. 中国科学院空间应用工程与技术中心, 北京 100094;
    2. 中国科学院大学, 北京 100049;
    3. 北京自动化工程学校, 北京 100101
  • 收稿日期:2019-06-05 修回日期:2019-07-26 发布日期:2021-03-05
  • 通讯作者: 吕从民
  • 基金资助:
    国家自然科学基金(61703391)和中国科学院空间应用工程与技术中心前瞻性课题(CSU-QZKT-201714)资助

System-level accelerated reliability demonstration testing design based on fuzzy logic and AHP

LI Peng1,2, DANG Wei1,2, LI Tao3, Lü Congmin1,2   

  1. 1. Technology & Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China;
    2. University of Chinese Academy of Sciences, Beijing 100049, China;
    3. Beijing Automatic Engineering School, Beijing 100101, China
  • Received:2019-06-05 Revised:2019-07-26 Published:2021-03-05

摘要: 传统的基于统计方法的可靠性验证试验的样本量大、试验时间长,难以满足现今高可靠性、长寿命电子产品研制的短周期和低成本要求。工作采用“数理统计+故障物理”的方法,针对多失效产品提出系统多应力加速验证试验方法。基于系统可靠性指标按环境应力进行分配的思路,从功能、结构、机理、应力4个层次确定出关键功能、薄弱环节、主要失效模式及敏感环境应力,逐级进行可靠性指标分解,构建可靠性综合试验与单项环境试验关系,设计出试验方案和试验剖面。首先研究模糊层次分析可靠性分配方法,将系统可靠性指标分配至各单元的敏感应力,接着采用应力-强度干涉模型推导各应力放大系数,然后由加速因子不变原则推导出系统加速因子,结合统计试验方案,设计系统加速验证试验方案。最后,以某固态硬盘试验验证为例,阐述整套流程,并与GJB899A和IEC62506标准方法进行对比,显示了本方法的有效性。

关键词: 加速试验, 可靠性验证, 可靠性分配, 模糊逻辑, 层次分析法, 故障物理

Abstract: The traditional statistical analysis-based reliability demonstration testing (RDT) requires a large number of samples and long testing time, failing to satisfy the development demand for short cycle and low cost of electronic products nowadays. We propose a system-level reliability accelerated demonstration testing (RADT) program for multi-failure mode products under multiple stresses by combining mathematical statistics and physics of failure (PoF). Based on the principle of allocating reliability target to each environment stress, products are decomposed at four levels, namely function, structure, mechanism, and stress, and the key function, weakness, dominant failure mode, and sensitive stress can be identified, respectively. After level-by-level allocations, the RADT plan and test profile can be established by connecting environmental testing and reliability testing. Firstly, system reliability is apportioned to each environmental stress based on fuzzy logic and analytic hierarchy process. Secondly, the stress-strength interference model is used to deduce the amplification coefficient for each stress. The overall acceleration factor can be derived by the principle of constant acceleration factor, and then the RADT scheme can be designed based on a statistical plan. A case example is presented to illustrate the effectiveness of the proposed approach in comparison with programs of GJB899A and IEC62506.

Key words: accelerated testing, reliability demonstration testing, reliability allocation, fuzzy logic, analytic hierarchy process, physics of failure

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