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Design of low temperature measurement experimental device based on superconductor magnetic penetration depth

  • ZHU Changyang ,
  • BIAN Xing ,
  • WANG Jinzhen ,
  • LIU Jie
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  • 1. College of Engineering Sciences, University of Chinese Academy of Sciences, Beijing 100049, China;
    2. Institute of Mechanics, Chinese Academy of Sciences, Beijing 100190, China;
    3. Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China

Received date: 2022-12-12

  Revised date: 2023-03-13

  Online published: 2023-03-13

Abstract

The magnetic penetration depth of the external magnetic field into the superconductor varies with the temperature, especially near the superconducting transition temperature, the penetration depth changes dramatically. Detecting the change of the penetration depth can achieve high-resolution measurement of temperature changes, which is an important principle of deep and low temperature measurement. Based on this basic principle, this work studies a temperature measurement scheme using the change of superconductor penetration depth, the quantization of closed superconducting loop magnetic flux and the superconducting quantum interference device (SQUID), carries out theoretical analysis and simulation, which is expected to achieve a temperature resolution of nK/$\sqrt{\mathrm{Hz}}$ in the liquid helium temperature region, and gives the specific experimental device design. This method offers high resolution, does not introduce additional heat flow, and does not require continuous current excitation. It can greatly reduce the adverse effects of the traditional temperature measurement caused by thermometer self-heating effect and contact thermal resistance. By plating superconducting film on the surface of the object,which is beneficial to temperature measurement experiments and applications below 10 K.

Cite this article

ZHU Changyang , BIAN Xing , WANG Jinzhen , LIU Jie . Design of low temperature measurement experimental device based on superconductor magnetic penetration depth[J]. Journal of University of Chinese Academy of Sciences, 2025 , 42(1) : 43 -49 . DOI: 10.7523/j.ucas.2023.020

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