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›› 2010, Vol. 27 ›› Issue (1): 117-126.DOI: 10.7523/j.issn.2095-6134.2010.1.015

• Research Articles • Previous Articles     Next Articles

Detection method for memory overrun in multi-loop programs

WANG Jia-Jie1, JIANG Fan1, ZHANG Tao2   

  1. 1. Department of Computer Science, University of Science and Technology of China, Hefei 230027, China;
    2. China Information Technology Security Evaluation Center, Beijing 100085, China
  • Received:2009-03-31 Revised:2009-06-09 Online:2010-01-15

Abstract:

A detection method for memory overrun is presented to overcome multi-loop problems: (1)identifies suspicious defects and their dependent regions; (2)analyzes multi-loops by CR# algebra; (3)infers probability of triggering defect and path guide information; (4)detects defects based on symbolic execution; and (5)finds defects, trigger paths, and program input. A prototype tool has been implemented, and it found real defects in several open source softwares. The results show that the new method can avoid blind path traversal while preserving path-sensitive and bit-level detection precision, and improve efficiency and veracity of defect detection.

Key words: software defect detection, static analysis, symbolic execution, loop analysis, CR# algebra

CLC Number: